COXEM, Pioneer in Electron Miscroscope

Scanning Electron Microscope, CX-100S
Versatile Tool to Access the Nano-World



The optical microscope is the most commonly used tool in surface metrology generally and it is widely used in educational programs, R&D and quality control. However, the optical microscope can not fulfill the growing demand for higher magnification due to its physical limitations. The CX-100S SEM is a powerful tool for surface characterization which produces high quality images with nano-scale resolution. Its software is using the graphical user interface and based-on and Microsoft Windows XP or 7.

Company website: www.coxem.com

Indispensable Tool for Materials Analysis

CX-100S is an indispensable tool for various application areas in materials analysis. It has a high resolution (3.5 nm at 30 kV acceleration voltage and SE detector) and a high magnification imaging for surface morphology in the nanoscale. The clean imaging is due to its long depth of focus.

User Friendly Operation
NanostationTM is the powerful software for the system control and image analysis for the CX-100S SEM. It is designed and based-on Microsoft Windows XP and adapted a user-friendly interface. NanostationTM allows for a customized toolbars for repeat job setup.

High Performance / Economic Grade
The CX-100S is a state-of-the-art SEM with a veriety of detector choices, the user can enjoy a high performance SEM at an economic price.

Rapid Analysis
The CX-100S uses an oil-free turbo molecular pump. The speed of the pump will allow for imaging in under five minutes up to 10-6 torr.

Diverse Range of Applications
CX-100S provides the best imaging solution over a wide spectrum of samples from bio-molecules to metal samples. The CX-100S can be equipped with additional detectors like EDS and/or BSE and can run both simultaneously.

Contact: sem.jeong@gmail.com